Jandel four point probe manual

These procedures apply to the Jandel Four-point Probe System with RM3 Test Unit. All maintenance should follow the procedures set forth in the manufacturer’s maintenance and operations manuals. This document is for reference only. Users must be trained by Nanofab staff before operating this equipment. Jandel Wafer Four Point Probe System There are two manual wafer probe stations available, one for wafers up to mm diameter, and the other for wafers up to mm diameter. more about Jandel Wafer Four Point Probe System. Maintenance and Use of the Jandel Engineering Ltd. Multi Height Probe and Multi Height Microposition Probe Application Measurement of resistivity of samples by the four point technique using a Jandel four point probe head. Principal Features Accomodates wafers up to 10" diameter and ingots up to 10" deep by 6" high. Width is limited only by need to.

1) A Jandel RM+ Test Unit 2) A power lead 3) A green case key which can be used to open the RM+ cabinet (not recommended) 4) A USB stick containing a copy of the manual and the RM+ software for computer control and exporting of results 5) A USB lead. During the four-probe operation all four needles rise and fall normally. The velocity control should be set as desired. The lead marked 4PL should be used to connect the probe to the Resistivity Test Unit. During three-probe operation the tension on the first probe should be reduced to zero and the lever pulled down. Maintenance and Use of the Jandel Engineering Ltd. Multi Height Probe and Multi Height Microposition Probe Application Measurement of resistivity of samples by the four point technique using a Jandel four point probe head. Principal Features Accomodates wafers up to 10" diameter and ingots up to 10" deep by 6" high. Width is limited only by need to.

We design and manufacturing manually operated semiconductor and thin film measuring systems, including the electronic current Jandel Four Point Probes. Resistivity measurement system with four point probe. Sample size: mm, maximum substrate thickness mm. Jandel RM Test Unit is a constant current. 2 The probehead can easily be damaged; do not bump anything in to the probes. Page 4. DOCUMENT:JANDEL RM3 Four-Point Probe System. Version: